A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

Lambrecht, NielsNielsLambrechtPues, H.H.PuesDe Zutter, DanielDanielDe ZutterVande Ginste, DriesDriesVande Ginste2021-10-252021-10-252018-080018-9375https://imec-publications.be/handle/20.500.12860/31110A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp testJournal articlehttp://ieeexplore.ieee.org/document/8097033/