Kilchytska, V.V.KilchytskaAlvarado, J.J.AlvaradoCollaert, NadineNadineCollaertRooyackers, RitaRitaRooyackersMilitaru, O.O.MilitaruBerger, G.G.BergerFlandre, D.D.Flandre2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/15593Total-dose effects caused by high-energy neutrons and g-rays in multiple-gate FETsProceedings paper