Modeling and experimental verification of substrate noise generation in a 220Kgates WLAN system-on-chip with multiple supplies

Badaroglu, MustafaMustafaBadarogluDonnay, StephaneStephaneDonnayDe Man, HugoHugoDe ManZinzius, Y.Y.ZinziusGielen, GeorgesGeorgesGielenFonden, T.T.Fonden2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/5975Modeling and experimental verification of substrate noise generation in a 220Kgates WLAN system-on-chip with multiple suppliesProceedings paper