Agopian, P.G.D.P.G.D.AgopianBordallo, C.C.BordalloSimoen, EddyEddySimoenClaeys, CorCorClaeysMartino, J.A.J.A.Martino2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20266The influence of different stress techniques and proton radiation on GIDL in triple-gate SOI devicesProceedings paper