Impact of the electronic band structure on the reliability of triple Layer a-VMCO devices

Belmonte, AttilioAttilioBelmonteGovoreanu, BogdanBogdanGovoreanuSubirats, AlexandreAlexandreSubiratsDi Piazza, LucaLucaDi PiazzaGoux, LudovicLudovicGouxKar, Gouri SankarGouri SankarKar2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/27825Impact of the electronic band structure on the reliability of triple Layer a-VMCO devicesProceedings paperhttp://ieeexplore.ieee.org/document/7936392/