Franco, JacopoJacopoFrancoKaczer, BenBenKaczerToledano Luque, MariaMariaToledano LuqueRoussel, PhilippePhilippeRousselCho, Moon JuMoon JuChoKauerauf, ThomasThomasKaueraufMitard, JeromeJeromeMitardEneman, GeertGeertEnemanWitters, LiesbethLiesbethWittersGrasser, TiborTiborGrasserGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22362Superior reliability of high mobility (Si)Ge channel pMOSFETsMeeting abstract