Cho, Moon JuMoon JuChoRitzenthaler, RomainRomainRitzenthalerKrom, RaymondRaymondKromHiguchi, YuichiYuichiHiguchiKaczer, BenBenKaczerChiarella, ThomasThomasChiarellaBoccardi, GuillaumeGuillaumeBoccardiTogo, MitsuhiroMitsuhiroTogoHoriguchi, NaotoNaotoHoriguchiKauerauf, ThomasThomasKaueraufGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-2120130741-3106https://imec-publications.be/handle/20.500.12860/22146Negative Bias Temperature Instability (NBTI) in p-FinFETs with 45-degree substrate rotationJournal article