Study of amorphous Cu-Te-Si thin films showing high thermal stability for application as a cation supply layer in conductive bridge random access memory devices

Devulder, WouterWouterDevulderOpsomer, KarlKarlOpsomerMinjauw, MatthiasMatthiasMinjauwMeersschaut, JohanJohanMeersschautJurczak, GosiaGosiaJurczakGoux, LudovicLudovicGouxDetavernier, ChristopheChristopheDetavernier2021-10-232021-10-2320162046-2069https://imec-publications.be/handle/20.500.12860/26549Study of amorphous Cu-Te-Si thin films showing high thermal stability for application as a cation supply layer in conductive bridge random access memory devicesJournal articlehttp://pubs.rsc.org/en/content/articlelanding/2016/RA/c6ra04064k#!divAbstract