Mohammed, MazharuddinMazharuddinMohammedVerhulst, AnneAnneVerhulstVerreck, DevinDevinVerreckDegraeve, RobinRobinDegraeveKaczer, BenBenKaczerSimoen, EddyEddySimoenSoree, BartBartSoreeVan de Put, MaartenMaartenVan de PutMocuta, AndaAndaMocutaCollaert, NadineNadineCollaertThean, AaronAaronTheanGroeseneken, GuidoGuidoGroeseneken2021-10-232021-10-2320160021-8979https://imec-publications.be/handle/20.500.12860/27027Electric-field induced quantum broadening of the characteristic energy level of traps in semiconductors and oxidesJournal articlehttp://aip.scitation.org/doi/10.1063/1.4972482