An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method

Zhou, L.L.ZhouBo, T.T.BoJi, Z.Z.JiYang, H.H.YangXu, H.H.XuLiu, Q.Q.LiuSimoen, EddyEddySimoenWang, X.X.WangMa, X.X.MaLi, Y.Y.LiYin, H.H.YinDu, A.A.DuZhao, C.C.ZhaoWang, W.W.Wang2021-10-292021-10-2920201530-4388https://imec-publications.be/handle/20.500.12860/36414An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress methodJournal articlehttps://ieeexplore.ieee.org/document/8952660