Croes, KristofKristofCroesLesniewska, AlicjaAlicjaLesniewskaWu, ChenChenWuCiofi, IvanIvanCiofiBanczerowska, AgaAgaBanczerowskaBriggs, BasoeneBasoeneBriggsDemuynck, StevenStevenDemuynckTokei, ZsoltZsoltTokeiBoemmels, JuergenJuergenBoemmelsSaad, Y.Y.SaadGao, WeiminWeiminGao2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25113Intrinisic reliability of local interconnects for N7 and beyondProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112670