Results of a high density flip chip on flex reliability test program

Vandecasteele, BjornBjornVandecasteeleVanfleteren, JanJanVanfleterenMäättänen, JarmoJarmoMäättänenLaitinen, TanjaTanjaLaitinende Maquillé, YannickYannickde Maquillé2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/8310Results of a high density flip chip on flex reliability test programProceedings paper