Goes, WolfgangWolfgangGoesToledano Luque, MariaMariaToledano LuqueSchanovsky, F.F.SchanovskyBina, M.M.BinaBaumgartner, O.O.BaumgartnerKaczer, BenBenKaczerGrasser, TiborTiborGrasser2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22406Multiphonon processes as the origin of reliability issuesProceedings paperhttp://ecst.ecsdl.org/content/58/7/31.abstract