Measurements of millimeter wave test structures for high speed chip testing

De Keulenaer, TimothyTimothyDe KeulenaerBan, YuYuBanTorfs, GuyGuyTorfsSercu, S.S.SercuDe Geest, JanJanDe GeestBauwelinck, JohanJohanBauwelinck2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23706Measurements of millimeter wave test structures for high speed chip testingProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6844529