Analog performance of standard and uinaxial strained triple-gate SOI FinFET under X-ray radiation

Bordallo, CaioCaioBordalloTeixeira, FernandoFernandoTeixeiraSilveira, MarcileiMarcileiSilveiraAgopian, Paula G.D.Paula G.D.AgopianMartino, Joao A.Joao A.MartinoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-222021-10-2220140268-1242https://imec-publications.be/handle/20.500.12860/23569Analog performance of standard and uinaxial strained triple-gate SOI FinFET under X-ray radiationJournal article