Pantano, NicolasNicolasPantanoChery, EmmanuelEmmanuelCheryOp de Beeck, MaaikeMaaikeOp de BeeckSlabbekoorn, JohnJohnSlabbekoornBeyne, EricEricBeyne2023-01-052022-09-172023-01-0520220569-5503WOS:000848765300188https://imec-publications.be/handle/20.500.12860/40439Broadband Characterization of Polymers under Reliability Stresses and Impact of Capping LayerProceedings paper10.1109/ECTC51906.2022.00195978-1-6654-7943-1WOS:000848765300188