Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring

Monta, KazukiKazukiMontaKataselas, LeonidasLeonidasKataselasFodor, FerencFerencFodorHatzopoulos, AlkisAlkisHatzopoulosNagata, MakotoMakotoNagataMarinissen, Erik JanErik JanMarinissen2022-03-142022-03-1420211530-1877WOS:000693413600007https://imec-publications.be/handle/20.500.12860/39443Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop MonitoringProceedings paper10.1109/ETS50041.2021.9465391978-1-6654-1849-2WOS:000693413600007