Study of the effect of multiple conductions on threshold voltage in a MIS-HEMT from 450 K down to 200 K

Perina, Welder F.Welder F.PerinaMartino, Joao A.Joao A.MartinoSimoen, EddyEddySimoenPeralagu, UthayasankaranUthayasankaranPeralaguCollaert, NadineNadineCollaertAgopian, Paula G. D.Paula G. D.Agopian2024-03-112023-12-142024-03-1120232832-420XWOS:001099057900032https://imec-publications.be/handle/20.500.12860/43249Study of the effect of multiple conductions on threshold voltage in a MIS-HEMT from 450 K down to 200 KProceedings paper10.1109/SBMicro60499.2023.10302604979-8-3503-1945-3WOS:001099057900032