Eneman, GeertGeertEnemanCollaert, NadineNadineCollaertVeloso, AnabelaAnabelaVelosoDe Keersgieter, AnAnDe KeersgieterDe Meyer, KristinKristinDe MeyerHoffmann, Thomas Y.Thomas Y.Hoffmann2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/18886On the efficiency of stress techniques in gate-last n-type bulk finfetsProceedings paper