Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon

Rotondaro, AntonioAntonioRotondaroHurd, TraceTraceHurdMertens, PaulPaulMertensSchmidt, HaraldHaraldSchmidtHeyns, MarcMarcHeynsSimoen, EddyEddySimoenVanhellemont, JanJanVanhellemontVegh, GerzsonGerzsonVeghClaeys, CorCorClaeysGräf, D.D.Gräf2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/324Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in siliconMeeting abstract