Suhane, AmitAmitSuhaneArreghini, AntonioAntonioArreghiniVan den Bosch, GeertGeertVan den BoschVandelli, LucaLucaVandelliPadovani, AndreaAndreaPadovaniBreuil, LaurentLaurentBreuilLarcher, LucaLucaLarcherDe Meyer, KristinKristinDe MeyerVan Houdt, JanJanVan Houdt2021-10-182021-10-1820100741-3106https://imec-publications.be/handle/20.500.12860/18053Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memoriesJournal article