Vanstreels, KrisKrisVanstreelsDe Wolf, IngridIngridDe WolfZahedmanesh, HoumanHoumanZahedmaneshBender, HugoHugoBenderGonzalez, MarioMarioGonzalezLefebvre, J.J.LefebvreBhowmick, S.S.Bhowmick2021-10-222021-10-2220140003-6951https://imec-publications.be/handle/20.500.12860/24747In-situ scanning electron microscopy study of fracture events during BEOL microbeam bending testsJournal articlehttp://dx.doi.org/10.1063/1.4902516