Koktavy, P.P.KoktavyKoktavy, B.B.KoktavySikula, J.J.SikulaClaeys, CorCorClaeysSimoen, EddyEddySimoen2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1304Noise characteristics and hot carrier stress of 0.7 µm MOSFETsProceedings paper