Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors

Musibau, SolomonSolomonMusibauPoumpouridis, N.N.PoumpouridisTsiara, ArtemisiaArtemisiaTsiaraFranco, JacopoJacopoFrancoBerciano, MathiasMathiasBercianoVan Campenhout, JorisJorisVan CampenhoutDe Wolf, IngridIngridDe WolfCroes, KristofKristofCroes2024-08-162024-08-162024979-8-3503-6977-91541-7026WOS:001229691100116https://imec-publications.be/handle/20.500.12860/44316Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si PhotodetectorsProceedings paper10.1109/IRPS48228.2024.10529439979-8-3503-6976-2WOS:001229691100116