Kauerauf, ThomasThomasKaueraufButera, GeniGeniButeraCroes, KristofKristofCroesDemuynck, StevenStevenDemuynckWilson, ChrisChrisWilsonRoussel, PhilippePhilippeRousselDrijbooms, ChrisChrisDrijboomsBender, HugoHugoBenderLofrano, MelinaMelinaLofranoVandevelde, BartBartVandeveldeTokei, ZsoltZsoltTokeiGroeseneken, GuidoGuidoGroeseneken2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/17356Degradation and failure analysis of copper and tungsten contacts under high fluence stressProceedings paper