Friedt, Jean-MichelJean-MichelFriedtChoi, Kang-HoonKang-HoonChoiFrederix, FilipFilipFrederixCampitelli, AndrewAndrewCampitelli2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7588Simultaneous AFM and QCM measurements: methodology validation using electrodepositionJournal article