Experimental identification of unique oxide defect regions by characteristic response of charge pumping

Masuduzzaman, M.M.MasuduzzamanIslam, AhmadAhmadIslamDegraeve, RobinRobinDegraeveCho, Moon JuMoon JuChoZahid, MohammedMohammedZahidAlam, M.A.M.A.Alam2021-10-192021-10-192011-04https://imec-publications.be/handle/20.500.12860/19402Experimental identification of unique oxide defect regions by characteristic response of charge pumpingProceedings paper