Random telegraph noise: the key to single defect studies in nano-devices

Simoen, EddyEddySimoenFang, WenWenFangAoulaiche, MarcMarcAoulaicheLuo, JunJunLuoZhao, ChaoChaoZhaoClaeys, CorCorClaeys2021-10-232021-10-2320160040-6090https://imec-publications.be/handle/20.500.12860/27316Random telegraph noise: the key to single defect studies in nano-devicesJournal articlehttps://doi.org/10.1016/j.tsf.2015.08.037