Pavanello, M.A.M.A.PavanelloMartino, J.A.J.A.MartinoSimoen, EddyEddySimoenRooyackers, RitaRitaRooyackersCollaert, NadineNadineCollaertClaeys, CorCorClaeys2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12679Evaluation of triple-gate FinFETs with SiO2-HfO2-TiN gate stack under analog operationJournal article