Copper electromigration; prediction of scaling limits

Zahedmanesh, HoumanHoumanZahedmaneshVarela Pedreira, OlallaOlallaVarela PedreiraWilson, ChrisChrisWilsonTokei, ZsoltZsoltTokeiCroes, KristofKristofCroes2021-10-282021-10-282019https://imec-publications.be/handle/20.500.12860/34511Copper electromigration; prediction of scaling limitsProceedings paperhttps://iitc-conference.org/2019-iitc-mam-program/