Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity

Chizhik, S. A.S. A.ChizhikMatvienko, A. A.A. A.MatvienkoSidelnikov, A. A.A. A.SidelnikovProost, JorisJorisProost2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4191Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivityJournal article