Gupta, CharuCharuGuptaGupta, AnshulAnshulGuptaTuli, ShikharShikharTuliBury, ErikErikBuryParvais, BertrandBertrandParvaisDixit, AbhisekAbhisekDixit2021-10-282021-10-2820200018-9383https://imec-publications.be/handle/20.500.12860/35220Characterization and modeling of hot carrier degradation in N-channel gate-all-around nanowire FETsJournal articlehttps://ieeexplore.ieee.org/document/8930596