Franco, JacopoJacopoFrancoKaczer, BenBenKaczerToledano Luque, MariaMariaToledano LuqueBukhori, Muhammad FaizMuhammad FaizBukhoriRoussel, PhilippePhilippeRousselGrasser, TiborTiborGrasserAsenov, AsenAsenAsenovGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-2020120741-3106https://imec-publications.be/handle/20.500.12860/20691Impact of individual charged gate oxide defects on the entire ID-VG characteristic of nanoscaled FETsJournal article