Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited

Janssens, KoenraadKoenraadJanssensVan Der Biest, O.O.Van Der BiestVanhellemont, JanJanVanhellemontMaes, HermanHermanMaesHull, R.R.Hull2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/692Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging RevisitedOral presentation