Rittersma, ChrisChrisRittersmaSimoen, EddyEddySimoenSrinivasan, PurushothamanPurushothamanSrinivasanVertregt, M.M.VertregtClaeys, CorCorClaeys2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11107Mixed-signal and noise properties of nMOSFETs with HfSiON/TaN gate stacksProceedings paper