Das, JohanJohanDasDegraeve, RobinRobinDegraeveGroeseneken, GuidoGuidoGroesenekenStein, S.S.SteinKohlstedt, H.H.KohlstedtBorghs, GustaafGustaafBorghsDe Boeck, JoJoDe Boeck2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7382Statistical model for prebreakdown current jumps and breakdown caused by single traps in magnetic tunnel junctionsJournal article