Zhang, WenqiWenqiZhangBrongersma, SywertSywertBrongersmaRichard, OlivierOlivierRichardBrijs, BertBertBrijsPalmans, RogerRogerPalmansFroyen, LudoLudoFroyenMaex, KarenKarenMaex2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9976Microstructure and resistivity characterization of CuAu I superlattice formed in Cu/Au thin filmsJournal article