Priesol, JurajJurajPriesolSatka, AlexanderAlexanderSatkaChvala, AlesAlesChvalaStoffels, SteveSteveStoffelsDe Jaeger, BriceBriceDe JaegerDecoutere, StefaanStefaanDecoutere2022-02-252022-02-2520210018-9383WOS:000603033200017https://imec-publications.be/handle/20.500.12860/39150Identification of Electrically Stressed Regions in AlGaN/GaN-on-Si Schottky Barrier Diode Using EBIC TechniqueJournal article10.1109/TED.2020.3039756WOS:000603033200017ELECTRONDEGRADATIONPERFORMANCEMICROSCOPYDEVICES