Siau, S.S.SiauVervaet, A.A.VervaetVan Vaeck, L.L.Van VaeckSchacht, E.E.SchachtDemeter, U.U.DemeterVan Calster, AndreAndreVan Calster2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11200Adhesion strength of the epoxy polymer/copper interface for use in microelectronicsJournal article