Schulze, AndreasAndreasSchulzeCao, RupingRupingCaoEyben, PierrePierreEybenHantschel, ThomasThomasHantschelVandervorst, WilfriedWilfriedVandervorst2021-10-232021-10-2320160304-3991https://imec-publications.be/handle/20.500.12860/27286Outwitting the series resistance in scanning spreading resistance microscopyJournal articlehttp://www.sciencedirect.com/science/article/pii/S0304399115300711