Simple analytical model to study the STC bias point in FinFETs

Bellodi, M.M.BellodiCamillo, L.M.L.M.CamilloMartino, J.A.J.A.MartinoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/11712Simple analytical model to study the STC bias point in FinFETsProceedings paper