Kaczer, BenBenKaczerFranco, JacopoJacopoFrancoWeckx, PieterPieterWeckxRoussel, PhilippePhilippeRousselBury, ErikErikBuryCho, Moon JuMoon JuChoDegraeve, RobinRobinDegraeveLinten, DimitriDimitriLintenGroeseneken, GuidoGuidoGroesenekenKukner, HalilHalilKuknerRaghavan, PraveenPraveenRaghavanCatthoor, FranckyFranckyCatthoorRzepa, GerhardGerhardRzepaGoes, WolfgangWolfgangGoesGrasser, TiborTiborGrasser2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25447The defect-centric perspective of device and circuit reliability – from individual defects to circuitsProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7324754