Hantschel, ThomasThomasHantschelNiedermann, P.P.NiedermannTrenkler, ThomasThomasTrenklerVandervorst, WilfriedWilfriedVandervorst2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4415Highly conductive diamond probes for scanning spreading resistance microscopyJournal article