Ohyama, H.H.OhyamaHayama, K.K.HayamaTakakura, K.K.TakakuraSimoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchaClaeys, CorCorClaeys2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7939Effect of high-temperature electron irradiation in deep submicron MOSFETsOral presentation