Trenkler, ThomasThomasTrenklerStephenson, RobertRobertStephensonJansen, PhilippePhilippeJansenVandervorst, WilfriedWilfriedVandervorstHellemans, L.L.Hellemans2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3892New aspects of nanopotentiometry for MOSFET transistorsProceedings paper