Performance and reliability of 0.35μm/0.25μm HIMOS® technology for embedded flash memory applications

Wellekens, DirkDirkWellekensVan Houdt, JanJanVan HoudtVerheyen, PeterPeterVerheyenFrisson, JoJoFrissonLorenzini, MartinoMartinoLorenziniXue, GangGangXueMaes, HermanHermanMaes2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/4023Performance and reliability of 0.35μm/0.25μm HIMOS® technology for embedded flash memory applicationsProceedings paper