Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits

Lambrecht, NielsNielsLambrechtDe Zutter, DanielDanielDe ZutterVande Ginste, DriesDriesVande GinstePues, HugoHugoPues2021-10-242021-10-242017-07https://imec-publications.be/handle/20.500.12860/28748Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuitsProceedings paper