Waltl, MichaelMichaelWaltlKnobloch, TheresiaTheresiaKnoblochTselios, KonstantinosKonstantinosTseliosFilipovic, LadoLadoFilipovicStampfer, BernhardBernhardStampferHernandez, YoanlysYoanlysHernandezWaldhor, DominicDominicWaldhorIllarionov, YuryYuryIllarionovKaczer, BenBenKaczerGrasser, TiborTiborGrasser2022-12-152022-04-242022-05-052022-12-1520220935-9648WOS:000779849200001https://imec-publications.be/handle/20.500.12860/39669Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?Journal article10.1002/adma.202201082WOS:000779849200001FIELD-EFFECT TRANSISTORBIAS-TEMPERATURE INSTABILITYATOMIC LAYER DEPOSITIONRANDOM TELEGRAPH NOISEHIGH-PERFORMANCE WSE22-DIMENSIONAL MATERIALSWAFER-SCALEPROCESS VARIABILITYNBTI DEGRADATIONMOS2 TRANSISTORSMEDLINE:35318749