Tyaginov, StanislavStanislavTyaginovMakarov, AlexanderAlexanderMakarovKaczer, BenBenKaczerJech, MarkusMarkusJechVaisman Chasin, AdrianAdrianVaisman ChasinGrill, AlexanderAlexanderGrillHellings, GeertGeertHellingsVexler, MikhailMikhailVexlerLinten, DimitriDimitriLintenGrasser, TiborTiborGrasser2021-10-262021-10-2620181063-7826https://imec-publications.be/handle/20.500.12860/31987Impact of the device geometric parameters on hot-carrier degradation in FinFETsJournal articlehttps://link.springer.com/article/10.1134/S1063782618130183