Czerwinski, A.A.CzerwinskiTomaszewski, D.D.TomaszewskiGibki, J.J.GibkiBakowski, A.A.BakowskiKlima, K.K.KlimaKatcki, J.J.KatckiSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/1788Optimised diode analysis of electrical silicon substrate propertiesProceedings paper